Reply to "remarks on the electrochemical application of optical methods for the determination of stress in electrodes by T.A. Rokob, G.G. Láng", Electrochim. Acta 51 (2005) 93-97

Electrochimica Acta

Volumn 51, Issue 3, 2005, Pages 566-567

  Go, Joo Young ^a   Shin, Heon Cheol ^b   Pyun, Su Il ^a,c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung SDI   (South Korea)

^c ISE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLYTES; LASER BEAMS; LITHIUM; OPTICAL SYSTEMS; STOICHIOMETRY; STRESS ANALYSIS;

LASER BEAM DEFLECTION METHOD (LBDM); OPTICAL METHODS; REFLECTED BEAM; STRESS CHANGE;

ELECTROCHEMISTRY;

EID: 26844464772     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.04.040     Document Type: Note

References (7)

1. S.-I. Pyun, J.-Y. Go, and T.-S. Jang Electrochim. Acta 49 2004 4477
2. G.G. Láng, and M. Seo J. Electroanal. Chem. 490 2000 98
3. G.G. Stoney Proc. R. Soc. Lond. Ser. A 82 1909 172
4. G. Moulard, G. Contoux, G. Motyl, G. Gardet, and M. Courbon J. Vac. Sci. Technol. A 16 1998 736
5. S.N.G. Chu J. Electrochem. Soc. 145 1998 3621
6. C.A. Klein J. Appl. Phys. 88 2000 5487
7. Y.-H. Kim, S.-I. Pyun, J.-Y. Go, Electrochim. Acta, in press.