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Volumn , Issue , 2005, Pages 544-547

On-chip hermetic packaging enabled by post-deposition electrochemical etching of polysilicon

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; ENCAPSULATION; ETCHING; HERMETIC DEVICES; LEAK DETECTION; MICROPROCESSOR CHIPS; POLYSILICON; SILICON WAFERS;

EID: 26844450638     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (14)
  • 3
    • 0034317743 scopus 로고    scopus 로고
    • MEMS post-packaging by localized heating and bonding
    • L. Lin, "MEMS post-packaging by localized heating and bonding," Journal of Microelectromechanical Systems, vol. 23, pp. 608-616, 2000.
    • (2000) Journal of Microelectromechanical Systems , vol.23 , pp. 608-616
    • Lin, L.1
  • 4
    • 0032687820 scopus 로고    scopus 로고
    • Low pressure and low temperature hermetic wafer bonding using microwave heating
    • Orlando, FL
    • N. K. Budraa, H. W. Jackson, M. Barmatz, W. T. Pike, and J. D. Mai, "Low pressure and low temperature hermetic wafer bonding using microwave heating," IEEE MEMS'99 Conference, Orlando, FL, 1999, pp. 490-492.
    • (1999) IEEE MEMS'99 Conference , pp. 490-492
    • Budraa, N.K.1    Jackson, H.W.2    Barmatz, M.3    Pike, W.T.4    Mai, J.D.5
  • 12
    • 1942436715 scopus 로고    scopus 로고
    • A low-temperature thin-film electroplated metal vacuum package
    • B. H. Stark and K. Najafi, "A low-temperature thin-film electroplated metal vacuum package," Journal of Microelectromechanical Systems, vol. 13, pp. 147-157, 2004.
    • (2004) Journal of Microelectromechanical Systems , vol.13 , pp. 147-157
    • Stark, B.H.1    Najafi, K.2
  • 13
    • 0025440924 scopus 로고
    • Microstructure and lattice distortion of anodized porous silicon layers
    • H. Sugiyama and O. Nittono, "Microstructure and lattice distortion of anodized porous silicon layers," Journal of Crystal Growth, vol. 103, pp. 156-163, 1990.
    • (1990) Journal of Crystal Growth , vol.103 , pp. 156-163
    • Sugiyama, H.1    Nittono, O.2
  • 14
    • 21644440379 scopus 로고    scopus 로고
    • Post-deposition porous etching of polysilicon: Fabrication and characterization of free-standing structures
    • Anaheim, California, Nov. (to appear)
    • R. He and C.-J. Kim, "Post-deposition porous etching of polysilicon: fabrication and characterization of free-standing structures," Proceedings of 2004 ASME International Mechanical Engineering Congress and Exposition, Anaheim, California, Nov. 2004 (to appear).
    • (2004) Proceedings of 2004 ASME International Mechanical Engineering Congress and Exposition
    • He, R.1    Kim, C.-J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.