Reaction layer growth in a substrate/polycrystalline film system

Acta Materialia

Volumn 53, Issue 19, 2005, Pages 5189-5202

  Krishnamurthy, R ^a   Srolovitz, D J ^a  

^a Princeton University   (United States)

Author keywords

Grain boundaries; Peg; Reaction layer; Residual stresses; Thin films

Indexed keywords

GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INTERFACIAL ENERGY; MORPHOLOGY; REACTION KINETICS; RESIDUAL STRESSES; STRAIN; STRESS ANALYSIS; THERMODYNAMICS; THIN FILMS;

PEG FORMATION; POLYCRYSTALLINE FILMS; REACTANTS; REACTION LAYERS;

POLYCRYSTALLINE MATERIALS;

EID: 26644472179     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.08.008     Document Type: Article

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