Accurate and highly resolving quadri-wave lateral shearing interferometer, from visible to IR

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5776, Issue , 2005, Pages 134-143

  Velghe, Sabrina ^a   Primot, Jérôme ^a   Guérineau, Nicolas ^a   Haïdar, Riad ^a   Cohen, Mathieu ^b   Wattellier, Benoit ^b  

^a ONERA   (France)

^b ECOLE POLYTECHNIQUE   (France)

Author keywords

Fringe analysis; Interferometry; Laser beam shaping; Metrology; Phase measurement

Indexed keywords

FRINGE ANALYSIS; LASER BEAM SHAPING; MULTIPLE WAVE LATERAL SHEARING INTERFEROMETERS (MWLSI); WAVEFRONT DISTORTIONS;

INFRARED RADIATION; INTERFEROMETRY; LASER APPLICATIONS; LASER BEAM EFFECTS; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; PHASE MEASUREMENT; WAVEFRONTS;

INTERFEROMETERS;

EID: 26444564218     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.611606     Document Type: Conference Paper

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