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Volumn 45, Issue 5, 2005, Pages 451-456

Instantaneous phase-stepping interferometry using polarization imaging with a micro-retarder array

Author keywords

Form birefringence; Instantaneous phase stepping interferometry; Micro retarder array; Out of plane displacement; Polarization; Twyman Green interferometry

Indexed keywords

BIREFRINGENCE; CAMERAS; CHARGE COUPLED DEVICES; INTERFEROMETERS; LIGHT POLARIZATION; POLARIMETERS;

EID: 26444508026     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1177/0014485105057761     Document Type: Article
Times cited : (25)

References (28)
  • 1
    • 0242695728 scopus 로고    scopus 로고
    • "Thermal Stresses in Microelectronics Subassemblies: Quantitative Characterization Using Photomechanics Methods"
    • Han, B., "Thermal Stresses in Microelectronics Subassemblies: Quantitative Characterization Using Photomechanics Methods," Journal of Thermal Stresses, 26(6), 583-613 (2003).
    • (2003) Journal of Thermal Stresses , vol.26 , Issue.6 , pp. 583-613
    • Han, B.1
  • 2
    • 0032019329 scopus 로고    scopus 로고
    • "Moiré Strain Analysis: An Introduction, Review and Critique, Including Related Techniques and Future Potential"
    • McKelvie, J., "Moiré Strain Analysis: An Introduction, Review and Critique, Including Related Techniques and Future Potential," Journal of Strain Analysis for Engineering Design, 33(2), 137-151 (1998).
    • (1998) Journal of Strain Analysis for Engineering Design , vol.33 , Issue.2 , pp. 137-151
    • McKelvie, J.1
  • 3
    • 0033102372 scopus 로고    scopus 로고
    • "Investigation on Mechanism of Plastic Deformation by Digital Speckle Pattern Interferometry"
    • Gong, X.L. and Toyooka, S., "Investigation on Mechanism of Plastic Deformation by Digital Speckle Pattern Interferometry," EXPERIMENTAL MECHANICS, 39(1), 25-29 (1999).
    • (1999) Experimental Mechanics , vol.39 , Issue.1 , pp. 25-29
    • Gong, X.L.1    Toyooka, S.2
  • 4
    • 0029264173 scopus 로고
    • "An Interpretation of Twyman-Green Interferograms from Static and Dynamic Fracture Experiments"
    • Pfaff, R.D., Washabaugh, P.D., and Knauss, W. G., "An Interpretation of Twyman-Green Interferograms from Static and Dynamic Fracture Experiments," International Journal of Solids and Structures, 32(6-7), 939-955 (1995).
    • (1995) International Journal of Solids and Structures , vol.32 , Issue.6-7 , pp. 939-955
    • Pfaff, R.D.1    Washabaugh, P.D.2    Knauss, W.G.3
  • 5
    • 0011510752 scopus 로고
    • "Experimental Fracture Mechanics"
    • 2nd Edn., Kobayashi, A.S., ed., VCH Publishers, New York
    • Smith, C. W. and Kobayashi, A.S., "Experimental Fracture Mechanics," Handbook on Experimental Mechanics, 2nd Edn., Kobayashi, A.S., ed., VCH Publishers, New York, 905-968 (1993).
    • (1993) Handbook on Experimental Mechanics , pp. 905-968
    • Smith, C.W.1    Kobayashi, A.S.2
  • 6
    • 0032017693 scopus 로고    scopus 로고
    • "Automated Fringe Pattern Analysis in Experimental Mechanics: A Review"
    • Huntley, J.M., "Automated Fringe Pattern Analysis in Experimental Mechanics: A Review," Journal of Strain Analysis for Engineering Design, 33(2), 105-125 (1998).
    • (1998) Journal of Strain Analysis for Engineering Design , vol.33 , Issue.2 , pp. 105-125
    • Huntley, J.M.1
  • 7
    • 26444498615 scopus 로고    scopus 로고
    • "Methods of Interferogram Analysis"
    • Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford
    • Malacara, D., "Methods of Interferogram Analysis," Trends in Optical Non-destructive Testing and Inspection, Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford, 15-35 (2000).
    • (2000) Trends in Optical Non-Destructive Testing and Inspection , pp. 15-35
    • Malacara, D.1
  • 8
    • 0002001544 scopus 로고    scopus 로고
    • "Fringe Analysis"
    • Rastogi, P.K., ed., Springer, Berlin
    • Surrel, Y., "Fringe Analysis," Photomechanics, Rastogi, P.K., ed., Springer, Berlin, 55-102 (2000).
    • (2000) Photomechanics , pp. 55-102
    • Surrel, Y.1
  • 9
    • 9344252305 scopus 로고    scopus 로고
    • "Approaches in Generalized Phase Shifting Interferometry"
    • Patil, A. and Rastogi, P., "Approaches in Generalized Phase Shifting Interferometry," Optics and Lasers in Engineering, 43(3-5), 475-490 (2005).
    • (2005) Optics and Lasers in Engineering , vol.43 , Issue.3-5 , pp. 475-490
    • Patil, A.1    Rastogi, P.2
  • 10
    • 0000474784 scopus 로고    scopus 로고
    • "Real-time Phase Distribution Analysis in Moiré"
    • Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford
    • Morimoto, Y. and Fujigaki, M., "Real-time Phase Distribution Analysis in Moiré," Trends in Optical Non-destructive Testing and Inspection, Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford, 415-432 (2000).
    • (2000) Trends in Optical Non-Destructive Testing and Inspection , pp. 415-432
    • Morimoto, Y.1    Fujigaki, M.2
  • 11
    • 0036658707 scopus 로고    scopus 로고
    • "Real-time Measurement of Nanometer Displacement Distribution by Integrated Phase-shifting Method"
    • Series A
    • Fujigaki, M., Morimoto, Y., and Yabe, M., "Real-time Measurement of Nanometer Displacement Distribution by Integrated Phase-shifting Method," JSME International Journal, Series A, 45(3), 448-452 (2002).
    • (2002) JSME International Journal , vol.45 , Issue.3 , pp. 448-452
    • Fujigaki, M.1    Morimoto, Y.2    Yabe, M.3
  • 12
    • 26444535764 scopus 로고    scopus 로고
    • "Two-directional Phase-shifting Moiré Interferometry and Its Application to Thermal Deformation Measurement of Electronic Device"
    • Japanese Society for Non-Destructive Inspection, Tokyo
    • Yamamoto, Y., Morimoto, Y., Fujigaki, M., and Yoneyama, S., "Two-directional Phase-shifting Moiré Interferometry and Its Application to Thermal Deformation Measurement of Electronic Device," Proceedings of the 6th Far-East Conference on Non-Destructive Testing, Japanese Society for Non-Destructive Inspection, Tokyo, 445-450 (2002).
    • (2002) Proceedings of the 6th Far-East Conference on Non-Destructive Testing , pp. 445-450
    • Yamamoto, Y.1    Morimoto, Y.2    Fujigaki, M.3    Yoneyama, S.4
  • 13
    • 0037355476 scopus 로고    scopus 로고
    • "Real-time Analysis of Isochromatics and Isoclinics Using the Phase-shifting Method"
    • Yoneyama, S., Morimoto, Y., Nomura, T., Fujigaki, M. and Matsui, R., "Real-time Analysis of Isochromatics and Isoclinics Using the Phase-shifting Method," EXPERIMENTAL MECHANICS, 43(1), 83-89 (2003).
    • (2003) Experimental Mechanics , vol.43 , Issue.1 , pp. 83-89
    • Yoneyama, S.1    Morimoto, Y.2    Nomura, T.3    Fujigaki, M.4    Matsui, R.5
  • 14
    • 0037209638 scopus 로고    scopus 로고
    • "Photoelastic Fringe Pattern Analysis by real-time Phase-shifting Method"
    • Yoneyama, S., Morimoto, Y., and Matsui, R., "Photoelastic Fringe Pattern Analysis by real-time Phase-shifting Method," Optics and Lasers in Engineering, 39(1), 1-13 (2003).
    • (2003) Optics and Lasers in Engineering , vol.39 , Issue.1 , pp. 1-13
    • Yoneyama, S.1    Morimoto, Y.2    Matsui, R.3
  • 15
    • 0021467230 scopus 로고
    • "Instantaneous Phase Measuring Interferometry"
    • Smythe, R. and Moore, R., "Instantaneous Phase Measuring Interferometry," Optical Engineering, 23(4), 361-364 (1984).
    • (1984) Optical Engineering , vol.23 , Issue.4 , pp. 361-364
    • Smythe, R.1    Moore, R.2
  • 16
    • 85075532639 scopus 로고
    • "Simultaneous Phase Shift Interferometer"
    • Victor, J. and Doherty, D.V.M., eds., Proceedings of SPIE
    • Koliopoulos, C.L., "Simultaneous Phase Shift Interferometer," Advanced Optical Manufacturing and Testing II, Victor, J. and Doherty, D.V.M., eds., Proceedings of SPIE, 1531, 119-127 (1991).
    • (1991) Advanced Optical Manufacturing and Testing II , vol.1531 , pp. 119-127
    • Koliopoulos, C.L.1
  • 17
    • 0028476339 scopus 로고
    • "Real-time Displacement Measurement Using a Multicamera Phase-stepping Speckle Interferometer"
    • Van Haasteren, A.J.P. and Frankena, H.J., "Real-time Displacement Measurement Using a Multicamera Phase-stepping Speckle Interferometer," Applied Optics, 33(19), 4137-4142 (1994).
    • (1994) Applied Optics , vol.33 , Issue.19 , pp. 4137-4142
    • Van Haasteren, A.J.P.1    Frankena, H.J.2
  • 18
    • 0035312424 scopus 로고    scopus 로고
    • "Instantaneous Phase Shifting Arrangement for Microsurface Profiling of Flat Surfaces"
    • Ngoi, B.K.A., Venkatakrishnan, K., Sivakumar, N.R., and Bo, T., "Instantaneous Phase Shifting Arrangement for Microsurface Profiling of Flat Surfaces," Optical Communications, 190(1-6), 109-116 (2001).
    • (2001) Optical Communications , vol.190 , Issue.1-6 , pp. 109-116
    • Ngoi, B.K.A.1    Venkatakrishnan, K.2    Sivakumar, N.R.3    Bo, T.4
  • 19
    • 0037302262 scopus 로고    scopus 로고
    • "Large Surface Profile Measurement with Instantaneous Phase-shifting Interferometry"
    • Sivakumar, N.R., Hui, W., Venkatakrishnan, K., and Ngoi, B.K.A., "Large Surface Profile Measurement with Instantaneous Phase-shifting Interferometry." Optical Engineering, 42(2), 367-372 (2003).
    • (2003) Optical Engineering , vol.42 , Issue.2 , pp. 367-372
    • Sivakumar, N.R.1    Hui, W.2    Venkatakrishnan, K.3    Ngoi, B.K.A.4
  • 20
    • 0030565190 scopus 로고    scopus 로고
    • "Development of New Real-time Phase-shift Interferometry for the Investigation of Crystal Growth Kinetics"
    • Onuma, K., Nakamura, T., and Kuwashima, S., "Development of New Real-time Phase-shift Interferometry for the Investigation of Crystal Growth Kinetics," Journal of Crystal Growth, 167(1-2), 387-390 (1996).
    • (1996) Journal of Crystal Growth , vol.167 , Issue.1-2 , pp. 387-390
    • Onuma, K.1    Nakamura, T.2    Kuwashima, S.3
  • 23
    • 0041381130 scopus 로고    scopus 로고
    • "Visible-regime Polarimetric Imager: A Fully Polarimetric Real-time Imaging System"
    • Barter J.D., Thompson, H.R. Jr., and Christine, L.R., "Visible-regime Polarimetric Imager: A Fully Polarimetric Real-time Imaging System," Applied Optics, 42(9), 1620-1628 (2003).
    • (2003) Applied Optics , vol.42 , Issue.9 , pp. 1620-1628
    • Barter, J.D.1    Thompson Jr., H.R.2    Christine, L.R.3
  • 24
    • 2442490755 scopus 로고    scopus 로고
    • "Optical Elements with Subwavelength Structured Surfaces"
    • Kikuta, H., Toyota, H., and Yu, W., "Optical Elements with Subwavelength Structured Surfaces," Optical Review, 10(2), 63-73 (2003).
    • (2003) Optical Review , vol.10 , Issue.2 , pp. 63-73
    • Kikuta, H.1    Toyota, H.2    Yu, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.