-
1
-
-
0242695728
-
"Thermal Stresses in Microelectronics Subassemblies: Quantitative Characterization Using Photomechanics Methods"
-
Han, B., "Thermal Stresses in Microelectronics Subassemblies: Quantitative Characterization Using Photomechanics Methods," Journal of Thermal Stresses, 26(6), 583-613 (2003).
-
(2003)
Journal of Thermal Stresses
, vol.26
, Issue.6
, pp. 583-613
-
-
Han, B.1
-
2
-
-
0032019329
-
"Moiré Strain Analysis: An Introduction, Review and Critique, Including Related Techniques and Future Potential"
-
McKelvie, J., "Moiré Strain Analysis: An Introduction, Review and Critique, Including Related Techniques and Future Potential," Journal of Strain Analysis for Engineering Design, 33(2), 137-151 (1998).
-
(1998)
Journal of Strain Analysis for Engineering Design
, vol.33
, Issue.2
, pp. 137-151
-
-
McKelvie, J.1
-
3
-
-
0033102372
-
"Investigation on Mechanism of Plastic Deformation by Digital Speckle Pattern Interferometry"
-
Gong, X.L. and Toyooka, S., "Investigation on Mechanism of Plastic Deformation by Digital Speckle Pattern Interferometry," EXPERIMENTAL MECHANICS, 39(1), 25-29 (1999).
-
(1999)
Experimental Mechanics
, vol.39
, Issue.1
, pp. 25-29
-
-
Gong, X.L.1
Toyooka, S.2
-
4
-
-
0029264173
-
"An Interpretation of Twyman-Green Interferograms from Static and Dynamic Fracture Experiments"
-
Pfaff, R.D., Washabaugh, P.D., and Knauss, W. G., "An Interpretation of Twyman-Green Interferograms from Static and Dynamic Fracture Experiments," International Journal of Solids and Structures, 32(6-7), 939-955 (1995).
-
(1995)
International Journal of Solids and Structures
, vol.32
, Issue.6-7
, pp. 939-955
-
-
Pfaff, R.D.1
Washabaugh, P.D.2
Knauss, W.G.3
-
5
-
-
0011510752
-
"Experimental Fracture Mechanics"
-
2nd Edn., Kobayashi, A.S., ed., VCH Publishers, New York
-
Smith, C. W. and Kobayashi, A.S., "Experimental Fracture Mechanics," Handbook on Experimental Mechanics, 2nd Edn., Kobayashi, A.S., ed., VCH Publishers, New York, 905-968 (1993).
-
(1993)
Handbook on Experimental Mechanics
, pp. 905-968
-
-
Smith, C.W.1
Kobayashi, A.S.2
-
6
-
-
0032017693
-
"Automated Fringe Pattern Analysis in Experimental Mechanics: A Review"
-
Huntley, J.M., "Automated Fringe Pattern Analysis in Experimental Mechanics: A Review," Journal of Strain Analysis for Engineering Design, 33(2), 105-125 (1998).
-
(1998)
Journal of Strain Analysis for Engineering Design
, vol.33
, Issue.2
, pp. 105-125
-
-
Huntley, J.M.1
-
7
-
-
26444498615
-
"Methods of Interferogram Analysis"
-
Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford
-
Malacara, D., "Methods of Interferogram Analysis," Trends in Optical Non-destructive Testing and Inspection, Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford, 15-35 (2000).
-
(2000)
Trends in Optical Non-Destructive Testing and Inspection
, pp. 15-35
-
-
Malacara, D.1
-
8
-
-
0002001544
-
"Fringe Analysis"
-
Rastogi, P.K., ed., Springer, Berlin
-
Surrel, Y., "Fringe Analysis," Photomechanics, Rastogi, P.K., ed., Springer, Berlin, 55-102 (2000).
-
(2000)
Photomechanics
, pp. 55-102
-
-
Surrel, Y.1
-
9
-
-
9344252305
-
"Approaches in Generalized Phase Shifting Interferometry"
-
Patil, A. and Rastogi, P., "Approaches in Generalized Phase Shifting Interferometry," Optics and Lasers in Engineering, 43(3-5), 475-490 (2005).
-
(2005)
Optics and Lasers in Engineering
, vol.43
, Issue.3-5
, pp. 475-490
-
-
Patil, A.1
Rastogi, P.2
-
10
-
-
0000474784
-
"Real-time Phase Distribution Analysis in Moiré"
-
Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford
-
Morimoto, Y. and Fujigaki, M., "Real-time Phase Distribution Analysis in Moiré," Trends in Optical Non-destructive Testing and Inspection, Rastogi, P.K. and Inaudi, D., eds., Elsevier, Oxford, 415-432 (2000).
-
(2000)
Trends in Optical Non-Destructive Testing and Inspection
, pp. 415-432
-
-
Morimoto, Y.1
Fujigaki, M.2
-
11
-
-
0036658707
-
"Real-time Measurement of Nanometer Displacement Distribution by Integrated Phase-shifting Method"
-
Series A
-
Fujigaki, M., Morimoto, Y., and Yabe, M., "Real-time Measurement of Nanometer Displacement Distribution by Integrated Phase-shifting Method," JSME International Journal, Series A, 45(3), 448-452 (2002).
-
(2002)
JSME International Journal
, vol.45
, Issue.3
, pp. 448-452
-
-
Fujigaki, M.1
Morimoto, Y.2
Yabe, M.3
-
12
-
-
26444535764
-
"Two-directional Phase-shifting Moiré Interferometry and Its Application to Thermal Deformation Measurement of Electronic Device"
-
Japanese Society for Non-Destructive Inspection, Tokyo
-
Yamamoto, Y., Morimoto, Y., Fujigaki, M., and Yoneyama, S., "Two-directional Phase-shifting Moiré Interferometry and Its Application to Thermal Deformation Measurement of Electronic Device," Proceedings of the 6th Far-East Conference on Non-Destructive Testing, Japanese Society for Non-Destructive Inspection, Tokyo, 445-450 (2002).
-
(2002)
Proceedings of the 6th Far-East Conference on Non-Destructive Testing
, pp. 445-450
-
-
Yamamoto, Y.1
Morimoto, Y.2
Fujigaki, M.3
Yoneyama, S.4
-
13
-
-
0037355476
-
"Real-time Analysis of Isochromatics and Isoclinics Using the Phase-shifting Method"
-
Yoneyama, S., Morimoto, Y., Nomura, T., Fujigaki, M. and Matsui, R., "Real-time Analysis of Isochromatics and Isoclinics Using the Phase-shifting Method," EXPERIMENTAL MECHANICS, 43(1), 83-89 (2003).
-
(2003)
Experimental Mechanics
, vol.43
, Issue.1
, pp. 83-89
-
-
Yoneyama, S.1
Morimoto, Y.2
Nomura, T.3
Fujigaki, M.4
Matsui, R.5
-
14
-
-
0037209638
-
"Photoelastic Fringe Pattern Analysis by real-time Phase-shifting Method"
-
Yoneyama, S., Morimoto, Y., and Matsui, R., "Photoelastic Fringe Pattern Analysis by real-time Phase-shifting Method," Optics and Lasers in Engineering, 39(1), 1-13 (2003).
-
(2003)
Optics and Lasers in Engineering
, vol.39
, Issue.1
, pp. 1-13
-
-
Yoneyama, S.1
Morimoto, Y.2
Matsui, R.3
-
15
-
-
0021467230
-
"Instantaneous Phase Measuring Interferometry"
-
Smythe, R. and Moore, R., "Instantaneous Phase Measuring Interferometry," Optical Engineering, 23(4), 361-364 (1984).
-
(1984)
Optical Engineering
, vol.23
, Issue.4
, pp. 361-364
-
-
Smythe, R.1
Moore, R.2
-
16
-
-
85075532639
-
"Simultaneous Phase Shift Interferometer"
-
Victor, J. and Doherty, D.V.M., eds., Proceedings of SPIE
-
Koliopoulos, C.L., "Simultaneous Phase Shift Interferometer," Advanced Optical Manufacturing and Testing II, Victor, J. and Doherty, D.V.M., eds., Proceedings of SPIE, 1531, 119-127 (1991).
-
(1991)
Advanced Optical Manufacturing and Testing II
, vol.1531
, pp. 119-127
-
-
Koliopoulos, C.L.1
-
17
-
-
0028476339
-
"Real-time Displacement Measurement Using a Multicamera Phase-stepping Speckle Interferometer"
-
Van Haasteren, A.J.P. and Frankena, H.J., "Real-time Displacement Measurement Using a Multicamera Phase-stepping Speckle Interferometer," Applied Optics, 33(19), 4137-4142 (1994).
-
(1994)
Applied Optics
, vol.33
, Issue.19
, pp. 4137-4142
-
-
Van Haasteren, A.J.P.1
Frankena, H.J.2
-
18
-
-
0035312424
-
"Instantaneous Phase Shifting Arrangement for Microsurface Profiling of Flat Surfaces"
-
Ngoi, B.K.A., Venkatakrishnan, K., Sivakumar, N.R., and Bo, T., "Instantaneous Phase Shifting Arrangement for Microsurface Profiling of Flat Surfaces," Optical Communications, 190(1-6), 109-116 (2001).
-
(2001)
Optical Communications
, vol.190
, Issue.1-6
, pp. 109-116
-
-
Ngoi, B.K.A.1
Venkatakrishnan, K.2
Sivakumar, N.R.3
Bo, T.4
-
19
-
-
0037302262
-
"Large Surface Profile Measurement with Instantaneous Phase-shifting Interferometry"
-
Sivakumar, N.R., Hui, W., Venkatakrishnan, K., and Ngoi, B.K.A., "Large Surface Profile Measurement with Instantaneous Phase-shifting Interferometry." Optical Engineering, 42(2), 367-372 (2003).
-
(2003)
Optical Engineering
, vol.42
, Issue.2
, pp. 367-372
-
-
Sivakumar, N.R.1
Hui, W.2
Venkatakrishnan, K.3
Ngoi, B.K.A.4
-
20
-
-
0030565190
-
"Development of New Real-time Phase-shift Interferometry for the Investigation of Crystal Growth Kinetics"
-
Onuma, K., Nakamura, T., and Kuwashima, S., "Development of New Real-time Phase-shift Interferometry for the Investigation of Crystal Growth Kinetics," Journal of Crystal Growth, 167(1-2), 387-390 (1996).
-
(1996)
Journal of Crystal Growth
, vol.167
, Issue.1-2
, pp. 387-390
-
-
Onuma, K.1
Nakamura, T.2
Kuwashima, S.3
-
21
-
-
0036686562
-
"Dynamic Measurements in Supercritical Flow Using Instantaneous Phase-shift Interferometry"
-
Astrakharchik-Farrimond, E., Shekunov, B.Y., York, P., Sawyer, N.B.E., Morgan, S.P., Somekh, M.G., and See, C.W., "Dynamic Measurements in Supercritical Flow Using Instantaneous Phase-shift Interferometry," Experiments in Fluid, 33(2), 307-314 (2002).
-
(2002)
Experiments in Fluid
, vol.33
, Issue.2
, pp. 307-314
-
-
Astrakharchik-Farrimond, E.1
Shekunov, B.Y.2
York, P.3
Sawyer, N.B.E.4
Morgan, S.P.5
Somekh, M.G.6
See, C.W.7
-
23
-
-
0041381130
-
"Visible-regime Polarimetric Imager: A Fully Polarimetric Real-time Imaging System"
-
Barter J.D., Thompson, H.R. Jr., and Christine, L.R., "Visible-regime Polarimetric Imager: A Fully Polarimetric Real-time Imaging System," Applied Optics, 42(9), 1620-1628 (2003).
-
(2003)
Applied Optics
, vol.42
, Issue.9
, pp. 1620-1628
-
-
Barter, J.D.1
Thompson Jr., H.R.2
Christine, L.R.3
-
24
-
-
2442490755
-
"Optical Elements with Subwavelength Structured Surfaces"
-
Kikuta, H., Toyota, H., and Yu, W., "Optical Elements with Subwavelength Structured Surfaces," Optical Review, 10(2), 63-73 (2003).
-
(2003)
Optical Review
, vol.10
, Issue.2
, pp. 63-73
-
-
Kikuta, H.1
Toyota, H.2
Yu, W.3
-
25
-
-
0034870759
-
"Real-time Polarimeter with a Form-birefringent Micro Retarder Array"
-
Iwata, K., ed., Proceedings of SPIE
-
Kikuta, H., Haccho, H., Iwata, K., Hamamoto, T., Toyota, H., and Yotsuya, T., "Real-time Polarimeter with a Form-birefringent Micro Retarder Array," Optical Engineering for Sensing and Nanotechnology, Iwata, K., ed., Proceedings of SPIE, 4416, 19-22 (2001).
-
(2001)
Optical Engineering for Sensing and Nanotechnology
, vol.4416
, pp. 9-22
-
-
Kikuta, H.1
Haccho, H.2
Iwata, K.3
Hamamoto, T.4
Toyota, H.5
Yotsuya, T.6
-
26
-
-
0003626435
-
-
2nd Edn., Prentice-Hall, Englewood Cliffs, NJ
-
Gonzalez, R. C. and Woods, R.E., Digital Image Processing, 2nd Edn., Prentice-Hall, Englewood Cliffs, NJ (2002).
-
(2002)
Digital Image Processing
-
-
Gonzalez, R.C.1
Woods, R.E.2
-
28
-
-
0001350850
-
"Optimization of Retardance for a Complete Stokes Polarimeter"
-
Sabatke, D.S., Descour, M.R., Dereniak, E.L., Sweatt, W.G., Kemme, S.A., and Phipps, G.S., "Optimization of Retardance for a Complete Stokes Polarimeter," Optics Letters, 25(11), 802-804 (2000).
-
(2000)
Optics Letters
, vol.25
, Issue.11
, pp. 802-804
-
-
Sabatke, D.S.1
Descour, M.R.2
Dereniak, E.L.3
Sweatt, W.G.4
Kemme, S.A.5
Phipps, G.S.6
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