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Volumn 40, Issue 3, 2004, Pages 1751-1755

Electrostatic discharge and electrical breakdown study of the head-disk interface in a hard disk drive

Author keywords

Carbon overcoat; Electrical breakdown; Electrostatic discharge (BSD); Hard disk drive; Head disk interface

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTROSTATICS; GIANT MAGNETORESISTANCE; MAGNETIC RECORDING; SENSORS; TRANSDUCERS;

EID: 2642558096     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2003.821162     Document Type: Article
Times cited : (5)

References (11)
  • 1
    • 0000484611 scopus 로고    scopus 로고
    • Electrostatic discharge sensitivity of giant magnetoresistive recording heads
    • A. Wallash and Y. K. Kim, "Electrostatic discharge sensitivity of giant magnetoresistive recording heads," J. Appl. Phys., vol. 81, no. 8, pp. 4921-4923, 1997.
    • (1997) J. Appl. Phys. , vol.81 , Issue.8 , pp. 4921-4923
    • Wallash, A.1    Kim, Y.K.2
  • 2
    • 0029410061 scopus 로고
    • Electrostatic discharge damage of MR heads
    • Nov.
    • H. Tian and J. K. Lee, "Electrostatic discharge damage of MR heads," IEEE Trans. Magn., vol. 31, pp. 2624-2626, Nov. 1995.
    • (1995) IEEE Trans. Magn. , vol.31 , pp. 2624-2626
    • Tian, H.1    Lee, J.K.2
  • 3
    • 0036761754 scopus 로고    scopus 로고
    • Degradation of GMR and TMR recording heads using very short duration BSD transients
    • Sept.
    • L. Baril, M. Nichols, and A. Wallash, "Degradation of GMR and TMR recording heads using very short duration BSD transients," IEEE Trans. Magn., vol. 38, pp. 2283-2285, Sept. 2002.
    • (2002) IEEE Trans. Magn. , vol.38 , pp. 2283-2285
    • Baril, L.1    Nichols, M.2    Wallash, A.3
  • 4
    • 0032119751 scopus 로고    scopus 로고
    • Magnetic changes in GMR heads caused by electrostatic discharge
    • July
    • A. Wallash and Y. K. Kim, "Magnetic changes in GMR heads caused by electrostatic discharge," IEEE Trans. Magn., vol 34, pp. 1519-1521, July 1998.
    • (1998) IEEE Trans. Magn. , vol.34 , pp. 1519-1521
    • Wallash, A.1    Kim, Y.K.2
  • 6
    • 2642587997 scopus 로고    scopus 로고
    • Field emission caused by capacitance coupling in BSD in AMR/GMR heads
    • T. Ohtsu, H. Yoshida, and N. Hatanaka, "Field emission caused by capacitance coupling in BSD in AMR/GMR heads," in Proc. EOS/ESD Symp. 2001, pp. 172-174.
    • Proc. EOS/ESD Symp. 2001 , pp. 172-174
    • Ohtsu, T.1    Yoshida, H.2    Hatanaka, N.3
  • 7
    • 84948752281 scopus 로고    scopus 로고
    • Tribocharging and electrical breakdown at the magnetic recording head-disk interface
    • J. Himle and A. Wallash, "Tribocharging and electrical breakdown at the magnetic recording head-disk interface," in Proc. EOS/ESD Symp. 2002, pp. 142-147.
    • Proc. EOS/ESD Symp. 2002 , pp. 142-147
    • Himle, J.1    Wallash, A.2
  • 10
    • 0032157419 scopus 로고
    • Field-induced breakdown BSD damage of magnetoresistive recording heads
    • A. Wallash and M. Honda, "Field-induced breakdown BSD damage of magnetoresistive recording heads," J. Electrostatics, vol. 44, pp. 257-265, 1988.
    • (1988) J. Electrostatics , vol.44 , pp. 257-265
    • Wallash, A.1    Honda, M.2
  • 11
    • 0009127035 scopus 로고
    • Further studies in the emission of electrons from cold metals
    • M. Fowler and L. Nordheim, "Further studies in the emission of electrons from cold metals," Proc. R. Soc. Land. A, Math. Phys. Sci., vol. 124, p. 699, 1929.
    • (1929) Proc. R. Soc. Land. A, Math. Phys. Sci. , vol.124 , pp. 699
    • Fowler, M.1    Nordheim, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.