메뉴 건너뛰기




Volumn 184, Issue 2-3, 2004, Pages 291-297

Raman microscopic studies of residual and applied stress in PVD hard ceramic coatings and correlation with X-ray diffraction (XRD) measurements

Author keywords

PVD coatings and Bending; Raman microscopy; Residual stress; X Ray diffraction (XRD)

Indexed keywords

LATTICE VIBRATIONS; PHONONS; PHYSICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; STAINLESS STEEL; STRESS ANALYSIS; SUPERLATTICES; X RAY DIFFRACTION;

EID: 2642536921     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2003.10.014     Document Type: Article
Times cited : (48)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.