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Volumn 184, Issue 2-3, 2004, Pages 291-297
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Raman microscopic studies of residual and applied stress in PVD hard ceramic coatings and correlation with X-ray diffraction (XRD) measurements
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Author keywords
PVD coatings and Bending; Raman microscopy; Residual stress; X Ray diffraction (XRD)
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Indexed keywords
LATTICE VIBRATIONS;
PHONONS;
PHYSICAL VAPOR DEPOSITION;
RAMAN SPECTROSCOPY;
RESIDUAL STRESSES;
STAINLESS STEEL;
STRESS ANALYSIS;
SUPERLATTICES;
X RAY DIFFRACTION;
COMPLEMENTARITY;
POLYCRYSTALLINE COATINGS;
PVD HARD COATINGS;
RAMAN SPECTRAL SHIFTS;
CERAMIC COATINGS;
CERAMIC COATING;
CORROSION INHIBITING COATING;
DIFFRACTION;
MICROSCOPY;
X-RAY;
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EID: 2642536921
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2003.10.014 Document Type: Article |
Times cited : (48)
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References (19)
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