Limits and confidence intervals in the presence of nuisance parameters

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 551, Issue 2-3, 2005, Pages 493-503

  Rolke, Wolfgang A ^a   López, Angel M ^a   Conrad, Jan ^b  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^b CERN   (Switzerland)

Author keywords

Coverage; Maximum likelihood; Monte Carlo; Sensitivity

Indexed keywords

COMPUTATIONAL METHODS; MONTE CARLO METHODS; PROBLEM SOLVING; SENSITIVITY ANALYSIS; STATISTICAL METHODS; SYSTEMATIC ERRORS;

COVERAGE; MAXIMUM LIKELIHOOD; MONTE CARLO; SENSITIVITY;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 25644456667     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.05.068     Document Type: Article

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