On profile likelihood

Journal of the American Statistical Association

Volumn 95, Issue 450, 2000, Pages 449-465

  Murphy, S A ^a   Van Der Vaart, A W ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

Least favorable submodel; Likelihood ratio statistic; Maximum likelihood; Nuisance parameter; Semiparametric model; Standard error

Indexed keywords

EID: 1542637245     PISSN: 01621459     EISSN: 1537274X     Source Type: Journal    
DOI: 10.1080/01621459.2000.10474219     Document Type: Article

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