Transmission electron microscopy studies of a CeO2/Gd 2Zr2O7 buffer layer on an Ni-based alloy for YBCO coated conductor

Physica C: Superconductivity and its Applications

Volumn 412-414, Issue SPEC. ISS., 2004, Pages 813-818

  Kato, T ^a   Muroga, T ^b,c   Iijima, Y ^d   Saitoh, T ^d   Hirayama, T ^a   Hirabayashi, I ^b,c   Yamada, Y ^b,c   Izumi, T ^b,c   Shiohara, Y ^b,c   Ikuhara, Y ^a  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^c Fujikura Ltd ^*  (Japan)

^d FUJIKURA LTD   (Japan)

Author keywords

CeO2; Gd2Zr2O7; IBAD; In plane alignment; PLD; TEM

Indexed keywords

CERAMIC MATERIALS; CERIUM; ELECTRIC CONDUCTORS; GRAIN BOUNDARIES; ION BEAM ASSISTED DEPOSITION; MICROSTRUCTURE; NICKEL ALLOYS; NUCLEATION; OXYGEN; POLYCRYSTALS; PULSED LASER DEPOSITION;

BUFFER LAYERS; COATED CONDUCTORS; METAL TAPES; SELECTED AREA DIFFRACTION (SAD) PATTERNS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 4644281803     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.01.108     Document Type: Conference Paper

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