Magnetoresistive sensors for nondestructive evaluation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5770, Issue , 2005, Pages 1-13

  Jander, Albrecht ^a   Smith, Carl ^b   Schneider, Robert ^b  

^a OREGON STATE UNIVERSITY   (United States)

^b NVE CORPORATION   (United States)

Author keywords

Eddy current; Magnetoresistance; Multi frequency; Nondestructive evaluation

Indexed keywords

EDDY CURRENTS; INTEGRATED CIRCUITS; NONDESTRUCTIVE EXAMINATION; SENSORS;

MULTIFREQUENCY; NONDESTRUCTIVE EVALUATION;

MAGNETOSTRICTION;

EID: 25644446982     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.601826     Document Type: Conference Paper

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