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Volumn 15, Issue 1-4 SPEC, 2001, Pages 53-60
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Flaw detection using dc magnetic field measurement
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECTS;
EDDY CURRENT TESTING;
ELECTRIC CURRENTS;
HIGH TEMPERATURE APPLICATIONS;
INTERFACES (MATERIALS);
MAGNETIC FIELD MEASUREMENT;
PRESSURE;
FLAW DETECTION;
INTERNAL FLAWS;
MAGNETORESISTIVE SENSORS;
CONDUCTIVE MATERIALS;
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EID: 0035788991
PISSN: 13835416
EISSN: None
Source Type: Journal
DOI: 10.3233/jae-2002-430 Document Type: Article |
Times cited : (4)
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References (3)
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