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Volumn 15, Issue 1-4 SPEC, 2001, Pages 53-60

Flaw detection using dc magnetic field measurement

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; EDDY CURRENT TESTING; ELECTRIC CURRENTS; HIGH TEMPERATURE APPLICATIONS; INTERFACES (MATERIALS); MAGNETIC FIELD MEASUREMENT; PRESSURE;

EID: 0035788991     PISSN: 13835416     EISSN: None     Source Type: Journal    
DOI: 10.3233/jae-2002-430     Document Type: Article
Times cited : (4)

References (3)
  • 2
    • 0032186732 scopus 로고    scopus 로고
    • NDE of a 3-D surface crack using magnetic field induced by DC current flow
    • M. Saka, I. Sato and H. Abe, NDE of a 3-D Surface Crack Using Magnetic Field Induced by DC Current Flow, NDT and E Int. 31(5) (1998), 325-328.
    • (1998) NDT and E Int. , vol.31 , Issue.3 , pp. 325-328
    • Saka, M.1    Sato, I.2    Abe, H.3
  • 3
    • 0027557730 scopus 로고
    • Computation of 3-D magnetostatic fields using a reduced scalar potential
    • (March)
    • O. Biró, K. Preis, G. Vrisk, K.R. Richter and I. Ticar. Computation of 3-D Magnetostatic Fields Using a Reduced Scalar Potential, IEEE Trans. on Magnetics 29(2) (March 1993), 1329-1332.
    • (1993) IEEE Trans. on Magnetics , vol.29 , Issue.2 , pp. 1329-1332
    • Biró, O.1    Preis, K.2    Vrisk, G.3    Richter, K.R.4    Ticar, I.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.