RHEED study of the growth of Pd-Al/MgO bimetallic system

Vacuum

Volumn 80, Issue 1-3, 2005, Pages 102-107

  Nemšák, Slavomír ^a,b   Mašek, Karel ^a,b   Matolín, Vladimír ^a,b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Aluminum; Clusters; Electron energy loss spectroscopy (EELS); Palladium; Pd Al thin films; Reflection high energy electron diffraction (RHEED)

Indexed keywords

ALUMINUM; CRYSTALLINE MATERIALS; DEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; EPITAXIAL GROWTH; PALLADIUM; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS;

CLUSTERS; PD-AL THIN FILMS;

BIMETALS;

EID: 25444481286     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2005.07.047     Document Type: Conference Paper

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