Reflection high-energy electron loss spectroscopy (RHEELS): A new approach in the investigation of epitaxial thin film growth by reflection high-energy electron diffraction (RHEED)

Vacuum

Volumn 71, Issue 1-2 SPEC., 2003, Pages 59-64

  Masek K ^a   Moroz, V ^a   Matolin V ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Growth; Pd; RHEED; RHEELS

Indexed keywords

ALUMINA; DIFFRACTION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SURFACE STRUCTURE; THIN FILMS;

SURFACE PLASMONS;

EPITAXIAL GROWTH;

EID: 0037427423     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(02)00714-5     Document Type: Conference Paper

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