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Volumn 458, Issue 1-2, 2004, Pages 67-70
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Quantitative modelling of nucleation kinetics in experiments for poly-Si growth on SiO2 by hot wire chemical vapor deposition
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Author keywords
Diffusion on SiO2; Hot wire chemical vapor deposition; Nucleation kinetics
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Indexed keywords
ACTIVATION ENERGY;
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
DIFFUSION;
FILM GROWTH;
MONOMERS;
NUCLEATION;
REACTION KINETICS;
SILICA;
CRITICAL DENSITY;
HOT-WIRE CHEMICAL VAPOR DEPOSITION;
NUCLEATION KINETICS;
POLYSILICON;
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EID: 2542492507
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2003.11.302 Document Type: Article |
Times cited : (3)
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References (8)
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