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Volumn 17, Issue 5, 2004, Pages

Noise analysis for intrinsic and external shunted josephson junctions

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; DIFFERENTIAL EQUATIONS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; LOGIC CIRCUITS; SUPERCONDUCTING MATERIALS; THERMAL NOISE;

EID: 2542492288     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/5/004     Document Type: Conference Paper
Times cited : (16)

References (24)
  • 1
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    • RSFQ logic/memory family: A new Josephson-junction technology for sub-terahertz-clock-frequency digital systems
    • Likharev K K and Semenov V K 1991 RSFQ logic/memory family: a new Josephson-junction technology for sub-terahertz-clock-frequency digital systems IEEE Trans. Appl. Supercond. 1 3-27
    • (1991) IEEE Trans. Appl. Supercond. , vol.1 , pp. 3-27
    • Likharev, K.K.1    Semenov, V.K.2
  • 4
    • 0032660157 scopus 로고    scopus 로고
    • The effect of thermal noise on the operation of DC SQUIDs at 77 K - A fundamental analytical approach
    • Chesca B 1999 The effect of thermal noise on the operation of DC SQUIDs at 77 K - a fundamental analytical approach IEEE Trans. Appl. Supercond. 9 2955-60
    • (1999) IEEE Trans. Appl. Supercond. , vol.9 , pp. 2955-2960
    • Chesca, B.1
  • 5
    • 0032639115 scopus 로고    scopus 로고
    • Monte Carlo and thermal noise analysis of ultra-high-speed high temperature superconductor digital circuits
    • Jeffery M, Xie P Y, Whiteley S R and Van Duzer T 1999 Monte Carlo and thermal noise analysis of ultra-high-speed high temperature superconductor digital circuits IEEE Trans. Appl. Supercond. 9 4095-8
    • (1999) IEEE Trans. Appl. Supercond. , vol.9 , pp. 4095-4098
    • Jeffery, M.1    Xie, P.Y.2    Whiteley, S.R.3    Van Duzer, T.4
  • 6
    • 0035269124 scopus 로고    scopus 로고
    • A general approach for determining the switching probability in rapid single flux quantum logic circuits
    • Ortlepp Th, Toepfer H and Uhlmann H F 2001 A general approach for determining the switching probability in rapid single flux quantum logic circuits IEEE Trans. Appl. Supercond. 11 280-3
    • (2001) IEEE Trans. Appl. Supercond. , vol.11 , pp. 280-283
    • Ortlepp, Th.1    Toepfer, H.2    Uhlmann, H.F.3
  • 9
    • 0031163405 scopus 로고    scopus 로고
    • Stochastic simulation of SFQ logic
    • Satchell J 1997 Stochastic simulation of SFQ logic IEEE Trans. Appl. Supercond. 7 3315-8
    • (1997) IEEE Trans. Appl. Supercond. , vol.7 , pp. 3315-3318
    • Satchell, J.1
  • 10
    • 34547275473 scopus 로고
    • Brownian motion in a field of force and the diffusion model of chemical reactions
    • Kramers H A 1940 Brownian motion in a field of force and the diffusion model of chemical reactions Physica 7 284-304
    • (1940) Physica , vol.7 , pp. 284-304
    • Kramers, H.A.1
  • 13
    • 0029323990 scopus 로고
    • Complex dynamical behavior in RCL-shunted Josephson junctions
    • Whan C B and Lobb C J 1995 Complex dynamical behavior in RCL-shunted Josephson junctions IEEE Trans. Appl. Supercond. 5 3094-7
    • (1995) IEEE Trans. Appl. Supercond. , vol.5 , pp. 3094-3097
    • Whan, C.B.1    Lobb, C.J.2
  • 14
    • 2542482739 scopus 로고    scopus 로고
    • personal communication (ASC, Houston, TX)
    • Kadin A and Van Duzer T 2002 personal communication (ASC, Houston, TX)
    • (2002)
    • Kadin, A.1    Van Duzer, T.2
  • 19
    • 0026925167 scopus 로고
    • Noise analysis of the quantum flux parametron
    • Ko H L and Lee G S 1992 Noise analysis of the quantum flux parametron IEEE Trans. Appl. Supercond. 2 156-64
    • (1992) IEEE Trans. Appl. Supercond. , vol.2 , pp. 156-164
    • Ko, H.L.1    Lee, G.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.