Measuring optical phase singularities at subwavelength resolution

Journal of Optics A: Pure and Applied Optics

Volumn 6, Issue 5, 2004, Pages

  Dändliker, René ^a   Märki, Iwan ^a   Salt, Martin ^a   Nesci, Antonello ^a,b  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b EPFL   (Switzerland)

Author keywords

Interference microscopy; Micro lenses; Nano optics; Phase measurement; Phase singularities; Scanning optical probe microscopy; Sub wavelength features

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC FIELDS; FOURIER TRANSFORMS; LIGHT AMPLIFIERS; LIGHT INTERFERENCE; MICROLENSES; NEODYMIUM LASERS; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; PHOTODETECTORS; PHOTODIODES; PIEZOELECTRICITY;

INTERFERENCE MICROSCOPY; NANO-OPTICS; PHASE SINGULARITIES; SCANNING OPTICAL PROBE MICROSCOPY; SUB-WAVELENGTH FEATURES;

OPTICAL MICROSCOPY;

EID: 2542466851     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/6/5/009     Document Type: Conference Paper

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