X-ray fluorescence holography of 0.078 wt% copper in silicon steel

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 238, Issue 1-4, 2005, Pages 192-195

  Hayashi, Kouichi ^a   Hayashi, Tetsutaro ^a   Takahashi, Yukio ^a   Suzuki, Shigeru ^b   Matsubara, Eiichiro ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Impurity; Local structure; Silicon steel; X ray holography

Indexed keywords

CRYSTAL LATTICES; FLUORESCENCE; GRAPHITE; HOLOGRAPHY; PHOTODIODES; SILICON STEEL; SYNCHROTRON RADIATION; X RAYS;

IMPURITY; LOCAL STRUCTURE; X-RAY FLUORESCENCE HOLOGRAMS; X-RAY HOLOGRAPHY;

COPPER;

EID: 25144482930     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.06.047     Document Type: Conference Paper

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