Nanostructuring optical waveguides by focused ion beam milling: Near-field characterization

Journal of the Korean Physical Society

Volumn 47, Issue SUPPL. 1, 2005, Pages

  Lacour, Frédéric ^a   Sabac, Andrei ^a   Spajer, Michel ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

FIB milling; Nanostructures; Photonic band gap; Scanning near field optical microscopy; Waveguide characterization

Indexed keywords

EID: 25144463249     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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