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Volumn 491, Issue 1-2, 2005, Pages 212-216

Microstructure properties of nanocrystalline silicon/SiO2 multilayers fabricated by laser-induced crystallization

Author keywords

Constrained crystallization; Multilayers; Nanocrystalline Si; Pulsed laser

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; ELECTRON DIFFRACTION; HYDROGENATION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON; X RAY DIFFRACTION ANALYSIS;

EID: 25144457521     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.05.031     Document Type: Article
Times cited : (7)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.