Valence band electronic structure of V2O5 as determined by resonant soft X-ray emission spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 149, Issue 1-3, 2005, Pages 45-50

  Khyzhun, O Yu ^a   Strunskus, T ^a   Grunert W ^a   Woll Ch ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Electronic structure; NEXAFS; Vanadium oxide; X ray emission spectroscopy

Indexed keywords

CHARGE TRANSFER; ELECTRONIC STRUCTURE; PHOTONS; X RAY SPECTROSCOPY;

EXCITATION ENERGY; NEXAFS; VANADIUM OXIDE; X-RAY EMISSION SPECTROSCOPY;

VANADIUM COMPOUNDS;

EID: 25144440452     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.07.002     Document Type: Article

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