Application of ultraviolet photoelectron spectroscopy in the surface characterization of polycrystalline oxide catalysts. 2. Depth variation of the reduction degree in the surface region of partially reduced V2O5

Journal of Physical Chemistry B

Volumn 104, Issue 22, 2000, Pages 5288-5297

  Heber, M ^a,b   Grunert W ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; OXIDES; REDUCTION; ULTRAVIOLET SPECTROSCOPY; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

VANADIUM PENTOXIDE;

CATALYSTS;

EID: 0033729292     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp994188o     Document Type: Article

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36. 0, but this is not the case with eq 6 where ρ(z=0) = 0. It should be noted, however, that the reduction degree at z = 0 is merely a mathematical quantity. The reduction degree of the first monolayer can be obtained by averaging the ρ(z) profile over the monolayer thickness.