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Volumn 98, Issue 5, 2005, Pages
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Comprehensive study of Ohmic electrical characteristics and optimization of TiAlMoAu multilayer Ohmics on undoped AlGaNGaN heterostructure
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING TEMPERATURE;
METAL STACK SYSTEM;
OHMIC ELECTRICAL CHARACTERISTICS;
SAPPHIRE SUBSTRATES;
ALUMINUM COMPOUNDS;
ANNEALING;
MOLECULAR BEAM EPITAXY;
OHMIC CONTACTS;
OPTIMIZATION;
SCANNING ELECTRON MICROSCOPY;
TITANIUM COMPOUNDS;
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EID: 25144439898
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2035314 Document Type: Article |
Times cited : (16)
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References (7)
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