Non-conventional, inexpensive 3-D scanners for probe microscopy

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Mariani, T ^a   Frediani, C ^a   Ascoli, C ^a  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

3-D SCANNER; CONTROL ELECTRONICS; EDUCATIONAL INSTITUTIONS; POWER SUPPLY; PROBE MICROSCOPY;

COST REDUCTION; OPERATIONAL AMPLIFIERS; THREE DIMENSIONAL;

SCANNING;

EID: 25044476249     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051095     Document Type: Article

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