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Volumn 42, Issue 10, 2005, Pages 829-835

Fourier transform infrared microscopy and imaging: Detection of fungi in wood

Author keywords

Focal plane array detector; FTIR microscopy; Fungal identification; Fungal localization; Imaging; Wood colonization; Wood decay

Indexed keywords

ARTICLE; BEECH; CLUSTER ANALYSIS; FIBER; FOURIER TRANSFORM INFRARED MICROSCOPY; FUNGAL DETECTION; FUNGAL GENETICS; FUNGUS GROWTH; IMAGE ANALYSIS; IMAGING; INFRARED SPECTROSCOPY; INSTRUMENT; MICROSCOPY; MYCELIUM; NONHUMAN; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCHIZOPHYLLUM COMMUNE; SURFACE PROPERTY; TRAMETES VERSICOLOR; WOOD;

EID: 24944542219     PISSN: 10871845     EISSN: 10960937     Source Type: Journal    
DOI: 10.1016/j.fgb.2005.06.003     Document Type: Article
Times cited : (118)

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