A fading algorithm for sequential fault diagnosis

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2004, Pages 139-147

  Huang, Shi Yu ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BASELINE ENHANCEMENT; FADING ALGORITHM; FADING SCHEMES; FAULT EFFECT;

ALGORITHMS; LOGIC DESIGN;

FAULT TREE ANALYSIS;

EID: 24944468877     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2004.1347834     Document Type: Conference Paper

References (9)

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