A new novel means of transducing tensile stresses

PIERS 2005 - Progress in Electromagnetics Research Symposium, Proceedings

Volumn , Issue , 2005, Pages 89-91

  Wang, Wei Chih ^a   Chuang, Wei Ching ^c   Ho, Chi Ting ^c   Lian, Yi Ru ^b   Chao, Ching Kong ^b   Shyu, Ruey Fang ^c  

^a UNIVERSITY OF WASHINGTON   (United States)

^b NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; OPTICAL CORRELATION; POLYDIMETHYLSILOXANE; SILICONES; TENSILE STRESS; TENSILE TESTING;

HOLOGRAPHIC INTERFERENCE; MICROMOLDING TECHNIQUES; OPTICAL MEASUREMENT; POLYDIMETHYLSILOXANE POLYMERS; POLYMERIC SENSOR; RAMAN EXPERIMENTS; TRANSDUCING;

DIFFRACTION GRATINGS;

EID: 24944439151     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2529/piers041130131538     Document Type: Conference Paper

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