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Volumn 2, Issue , 2005, Pages 1594-1601

Fabrication of application specific integrated passive devices using wafer level packaging technologies

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; ELECTRONICS PACKAGING; STANDARDS; SYNTHESIS (CHEMICAL); SYSTEMS ANALYSIS; WSI CIRCUITS;

EID: 24644519094     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (15)
  • 2
    • 10444256779 scopus 로고    scopus 로고
    • Microelectronic packaging - Ready for the next product generation
    • Santa Clara, April 17-20
    • H. Reicht, J. Wolf, "Microelectronic Packaging - Ready for the Next Product Generation", HDI Conference, Santa Clara, April 17-20, 2001
    • (2001) HDI Conference
    • Reicht, H.1    Wolf, J.2
  • 3
    • 0033687377 scopus 로고    scopus 로고
    • Wafer Level Chip Scale Packaging (WLCSP): An overview
    • P. Garrou, "Wafer Level Chip Scale Packaging (WLCSP): An Overview", IEEE Transactions on Advanced Packaging, V. 23, 2000, pp. 197
    • (2000) IEEE Transactions on Advanced Packaging , vol.23 , pp. 197
    • Garrou, P.1
  • 10
    • 10444251352 scopus 로고    scopus 로고
    • Thin film multilayer wiring with photosensitive BCB on ceramic-, thick film- and LTCC-substrates for MCMs (german)
    • Nürnberg, April 22-24
    • M. Töpper, V. Glaw, R. Hahn, M. Schaldach, H. Reichl, "Thin Film Multilayer Wiring with photosensitive BCB on Ceramic-, Thick Film- and LTCC-Substrates for MCMs (german)", SMT/ES&H/Hybrid '97, Nürnberg, April 22-24, 1997
    • (1997) SMT/ES&H/Hybrid '97
    • Töpper, M.1    Glaw, V.2    Hahn, R.3    Schaldach, M.4    Reichl, H.5
  • 13
    • 0007868759 scopus 로고
    • Effect of surface roughness on eddy current losses at microwave frequencies
    • April
    • S. P. Morgan, "Effect of Surface Roughness on Eddy Current Losses at Microwave Frequencies", Journal of Applied Physics, Volume 20, April 1949, pp. 352-362
    • (1949) Journal of Applied Physics , vol.20 , pp. 352-362
    • Morgan, S.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.