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Volumn 1, Issue , 2005, Pages 120-126

Composition control for lead-free alloy electroplating on flip chip bumping

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; COPPER; ELECTRIC POTENTIAL; ELECTROPLATING; LEAD; SILVER; SOLDERING ALLOYS;

EID: 24644513993     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (10)
  • 1
    • 0011310828 scopus 로고    scopus 로고
    • Keep the reliability, dump the lead: Japanese companies accelerate lead-free packaging
    • November/December
    • Hamano, "Keep the Reliability, Dump the Lead: Japanese Companies Accelerate Lead-free Packaging," Chip Scale Review, November/December 2001, pp. 68-69.M.
    • (2001) Chip Scale Review
    • Hamano1
  • 2
    • 24644502674 scopus 로고    scopus 로고
    • Issue 11-Test, Assembly and Packaging, Section 9
    • Töpper and H. Reichl, Future Fab Inter-national, Issue 11-Test, Assembly and Packaging, Section 9 (2001).
    • (2001) Future Fab Inter-national
    • Töpper1    Reichl, H.2
  • 3
    • 24644477526 scopus 로고    scopus 로고
    • International conference on Lead-Free electronics
    • June 11-12, Brussels Belgium
    • R. Kiumi, et al., International conference on Lead-Free electronics "Towards implementation of the RHS Directive" June 11-12, 2003 Brussels Belgium
    • (2003) Towards Implementation of the RHS Directive
    • Kiumi, R.1
  • 4
    • 0032045668 scopus 로고    scopus 로고
    • Controlling solder joint voiding in BGA assembly
    • B.O. Wanda, and N. C. Lee, "Controlling Solder Joint Voiding in BGA Assembly," Surface Mount Technology Magazine, 1998, 12, 4, pp.68-72.
    • (1998) Surface Mount Technology Magazine , vol.12 , Issue.4 , pp. 68-72
    • Wanda, B.O.1    Lee, N.C.2
  • 5
    • 0034479501 scopus 로고    scopus 로고
    • Eutectic Sn-Ag solder bump process for ULSI flip chip technology
    • th ECTC Symp. pp.1095-1100 (2000).
    • (2000) th ECTC Symp. , pp. 1095-1100
    • Ezawa, H.1
  • 6
    • 0036292653 scopus 로고    scopus 로고
    • Process development of electroplate bumping for ULSI flip chip technology
    • th ECTC Symp. pp.711-716 (2002).
    • (2002) th ECTC Symp. , pp. 711-716
    • Kiumi, R.1
  • 7
    • 84950111084 scopus 로고    scopus 로고
    • Processing, properties, and reliability of electroplated lead-free solder bumps
    • R. Kiumi, et al., "Processing, Properties, and Reliability of Electroplated Lead-free Solder Bumps", IEEE/ITherm Symp. pp.909-714 (2002).
    • (2002) IEEE/ITherm Symp. , pp. 909-1714
    • Kiumi, R.1
  • 8
    • 23844535849 scopus 로고    scopus 로고
    • Electroplating process for lead-free bumping in flip chip packaging
    • R. Kiumi, et al., "Electroplating Process for Lead-free Bumping in Flip Chip Packaging", Advanced metallization Conference 2003 (AMC2003) pp.669-674.
    • Advanced Metallization Conference 2003 (AMC2003) , pp. 669-674
    • Kiumi, R.1
  • 9
    • 24644514378 scopus 로고    scopus 로고
    • International conference on Lead-Free electronics
    • Oct. 20-22, Frankfurt Germany
    • R. Kiumi, et al., International conference on Lead-Free electronics, Assemblies and Components; IPC/JEDEC 2004, Oct. 20-22, 2004 Frankfurt Germany.
    • (2004) Assemblies and Components; IPC/JEDEC 2004
    • Kiumi, R.1
  • 10


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.