A journey in the atomic-scale microstructure of materials using atom-probe tomography

Chinese Journal of Physics

Volumn 43, Issue 1 II, 2005, Pages 132-144

  Blavette, D ^a   Pareige, C ^a   Cadel, E ^a   Auger, P ^a   Deconihout, B ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24644513427     PISSN: 05779073     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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