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Volumn 50, Issue 5, 2002, Pages 957-966
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Atom probe tomography investigation of the microstructure of superalloys N18
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Author keywords
Atom probe; Grain boundaries; Microstructure; Nickel base superalloys; Segregation
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Indexed keywords
FIELD EMISSION MICROSCOPES;
FILMS;
GRAIN BOUNDARIES;
HEAT TREATMENT;
METALLOGRAPHIC MICROSTRUCTURE;
NICKEL ALLOYS;
PRECIPITATION (CHEMICAL);
SCANNING ELECTRON MICROSCOPY;
SEGREGATION (METALLOGRAPHY);
SOLID SOLUTIONS;
STOICHIOMETRY;
TOMOGRAPHY;
TRANSMISSION ELECTRON MICROSCOPY;
VOLUME FRACTION;
WETTING;
ATOM PROBE TOMOGRAPHY;
FIELD ION MICROSCOPY (FIM);
SUPERALLOYS;
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EID: 0037075764
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(01)00395-0 Document Type: Article |
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Times cited : (85)
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References (20)
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