Determination of the sp3 C content of a-C films through EELS analysis in the TEM

Surface and Coatings Technology

Volumn 200, Issue 1-4 SPEC. ISS., 2005, Pages 739-743

  Galvan, D ^a   Pei, Y T ^a   De Hosson, J Th M ^a   Cavaleiro, A ^b  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

a C; EELS; H free; sp3 sp2; TEM

Indexed keywords

AMORPHOUS FILMS; COATINGS; ELECTRON ENERGY LOSS SPECTROSCOPY; IONS; MAGNETRON SPUTTERING; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS HYBRIDIZATION; MAGNETRON SPUTTERED COATINGS;

DIAMOND LIKE CARBON FILMS;

COATING;

EID: 24644503099     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2005.02.071     Document Type: Article

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