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Volumn 3440, Issue , 2005, Pages 349-364

Symbolic test selection based on approximate analysis

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; FINITE AUTOMATA; MATHEMATICAL MODELS; PROBLEM SOLVING;

EID: 24644500355     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-31980-1_23     Document Type: Conference Paper
Times cited : (55)

References (16)
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    • Abstract intrepretation: A unified lattice model for static analysis of programs by construction or approximation of fixpoints
    • P. Cousot and R. Cousot. Abstract intrepretation: a unified lattice model for static analysis of programs by construction or approximation of fixpoints. In 4th ACM Symposium on Principles of Programming Languages, Los Angeles, CA, 1977.
    • (1977) 4th ACM Symposium on Principles of Programming Languages, Los Angeles, CA
    • Cousot, P.1    Cousot, R.2
  • 8
    • 84888265186 scopus 로고    scopus 로고
    • A temporal logic based theory of test coverage and generation
    • Springer-Verlag
    • H.S. Hong, I. Lee, O. Sokolsky, and H. Ural. A temporal logic based theory of test coverage and generation. In TAG AS '02, Grenoble, France, LNCS 2280. Springer-Verlag, 2002.
    • (2002) TAG AS '02, Grenoble, France, LNCS , vol.2280
    • Hong, H.S.1    Lee, I.2    Sokolsky, O.3    Ural, H.4
  • 10
    • 0042524429 scopus 로고    scopus 로고
    • Dynamic partitioning in linear relation analysis, application to the verification of reactive systems
    • B. Jeannet. Dynamic partitioning in linear relation analysis, application to the verification of reactive systems. Formal Methods in System Design, 23(1), 2003.
    • (2003) Formal Methods in System Design , vol.23 , Issue.1
    • Jeannet, B.1
  • 11
    • 24644484754 scopus 로고    scopus 로고
    • Symbolic test selection using approximate analysis
    • INRIA
    • B. Jeannet, T. Jéron, V. Rusu, and E. Zinovieva. Symbolic test selection using approximate analysis. Technical Report 1649, INRIA, 2004. Available at http://www.irisa.fr/bibli/publi/pi/2004/1649/1649.html.
    • (2004) Technical Report , vol.1649
    • Jeannet, B.1    Jéron, T.2    Rusu, V.3    Zinovieva, E.4
  • 12
    • 84957046265 scopus 로고    scopus 로고
    • Test generation derived from model-checking
    • Springer-Verlag
    • T. Jéron and P. Morel. Test generation derived from model-checking. In CAV'99, Trento, Italy, LNCS 1633. Springer-Verlag, 1999.
    • (1999) CAV'99, Trento, Italy, LNCS , vol.1633
    • Jéron, T.1    Morel, P.2
  • 13
    • 0030212784 scopus 로고    scopus 로고
    • Principles and methods of testing finite state machines - A survey
    • D. Lee and M. Yannakakis. Principles and Methods of Testing Finite State Machines - A Survey. Proceedings of the IEEE, 84(8), 1996.
    • (1996) Proceedings of the IEEE , vol.84 , Issue.8
    • Lee, D.1    Yannakakis, M.2
  • 15
    • 24644480564 scopus 로고    scopus 로고
    • Verification and symbolic test generation for safety properties
    • INRIA
    • V. Rusu, H. Marchand, and T. Jéron. Verification and symbolic test generation for safety properties. Technical Report 5285, INRIA, 2004. Available at http://www.inria.fr/rrrt/rr-5285.html.
    • (2004) Technical Report , vol.5285
    • Rusu, V.1    Marchand, H.2    Jéron, T.3
  • 16
    • 0000101791 scopus 로고    scopus 로고
    • Test generation with inputs, outputs and repetitive quiescence
    • J. Tretmans. Test generation with inputs, outputs and repetitive quiescence. Software - Concepts and Tools, 17(3), 1996.
    • (1996) Software - Concepts and Tools , vol.17 , Issue.3
    • Tretmans, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.