A temporal logic based theory of test coverage and generation

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 2280 LNCS, Issue , 2002, Pages 327-341

  Hong, Hyoung Seok ^a   Lee, Insup ^a   Sokolsky, Oleg ^a   Ural, Hasan ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CIRCUITS; MODEL CHECKING;

AUTOMATIC TEST GENERATION; BRANCHING TIME; CONTROL FLOWS; COVERAGE CRITERIA; FINITE STATE SYSTEMS; MODEL CHECKER; TEST COVERAGE; TEST GENERATIONS;

TEMPORAL LOGIC;

EID: 84888265186     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-46002-0_23     Document Type: Conference Paper

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