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Volumn 17, Issue 3, 1996, Pages 103-120

Test generation with inputs, outputs and repetitive quiescence

Author keywords

Specification; Test generation; Testing; Transition system

Indexed keywords


EID: 0000101791     PISSN: 09458115     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (371)

References (34)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.