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Volumn 1, Issue , 2005, Pages 802-808

Technology requirements for chip-on-chip packaging solutions

Author keywords

3 D Packaging; Chip on Chip Packaging; System in Package (SiP); Wafer Level Packaging

Indexed keywords

ELECTRIC WIRING; ELECTRONICS PACKAGING; FLIP CHIP DEVICES; MICROELECTRONICS; SILICON WAFERS; THICKNESS MEASUREMENT;

EID: 24644495781     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (19)
  • 1
    • 6744247095 scopus 로고    scopus 로고
    • Wafer-level packaging has arrived
    • Ocober
    • Phil Garrou "Wafer-Level Packaging Has Arrived" Semiconductor Int. Ocober 2000, p. 119
    • (2000) Semiconductor Int. , pp. 119
    • Garrou, P.1
  • 6
    • 24644467311 scopus 로고    scopus 로고
    • http://public.itrs.net/
  • 9
    • 0029733171 scopus 로고    scopus 로고
    • A multi-chip module, the basic building block for large area pixel detectors
    • K.-H. Becks et al, "A Multi-Chip Module, the Basic Building Block for Large Area Pixel Detectors", Proceedings of IEEE MCM Conf. (1996)]
    • (1996) Proceedings of IEEE MCM Conf.
    • Becks, K.-H.1
  • 13
    • 17744404194 scopus 로고    scopus 로고
    • Interfacial adhesion analysis of BCB / TiW / Cu / PbSn technology in wafer level packaging
    • New Orleans, May
    • M. Töpper, A. Achen, H. Reichl, "Interfacial Adhesion Analysis of BCB / TiW / Cu / PbSn Technology in Wafer Level Packaging", Proceedings ECTC 2003, New Orleans, May 2003
    • (2003) Proceedings ECTC 2003
    • Töpper, M.1    Achen, A.2    Reichl, H.3
  • 15
    • 33845598444 scopus 로고    scopus 로고
    • Das atlas experiment und fraunhofer IZM
    • TU Berlin, Germany, April
    • Ch. Grah, "Das Atlas Experiment und Fraunhofer IZM", AVT Workshop TU Berlin, Germany, April 2004
    • (2004) AVT Workshop
    • Grah, Ch.1
  • 18


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.