Nanoscale deformation measurement by using the hybrid method of gray-level and holographic interferometry

Optics and Lasers in Engineering

Volumn 44, Issue 1, 2006, Pages 80-91

  Chien, C H ^a   Wu, Y D ^a   Chiou, Y T ^b   Hsieh, C C ^a   Chen, Y C ^c   Chen, T P ^a,d   Tsai, M L ^a   Wang, C T ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^d FORTUNE INSTITUTE OF TECHNOLOGY   (Taiwan)

Author keywords

Fringe; Gray level; Holographic interferometry; Nanoscale deformation; Pixel

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; LIGHT SOURCES; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; PHASE SHIFT;

FRINGE; GRAY-LEVEL; NANOSCALE DEFORMATION; PIXEL;

HOLOGRAPHIC INTERFEROMETRY;

EID: 24644468130     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2004.12.011     Document Type: Article

References (12)

1. R. Czarnek, J. Lee, and T. Rantis Moiré interferometry with enhanced resolution Exp Tech 2 1990 24 28
2. M. Miller, L. Mohammed, and P. Ho Quantitative strain analysis of flip-chip electronic packages using phase-shifting moire' interferometry Opt Lasers Eng 36 2001 127 139
3. D. Zhang, M. Ma, and D. Arola Fringe skeletonizing using an improved derivative sign binary method Opt Lasers Eng 37 2002 51 62
4. S. Hisada, T. Suzuki, S. Nakahara, and T. Fujita Visualization and measurements of sound pressure distribution of ultrasonic wave by stroboscopic real-time holographic interferometry Jpn J Appl Phys 1 41 5 2002 3316 3324
5. J. Huntley Optical shape measurement technology: past, present and future SPIE Int Soc Opt Eng 4076 2000 162 173
6. A. Anand Tracing of interference fringes using average gray value and simultaneous row and column scan Opt Laser Technol 35 2 2003 73 79
7. L. Cai, Q. Liu, and X. Yang A simple method of contrast enhancement and extremum extraction for interference fringes Opt Laser Technol 35 4 2003 295 302
8. Y. Qin, J. Chen, and H. Fan The study and application of a new filtering method on electronic speckle pattern interferometric fringe Opt Lasers Eng 39 4 2003 449 456
9. C. Vest Holographic interferometry 1979 Wiley New York
10. K. Shibayama, and H. Uchiyama Measurement of three-dimensional displacements by hologram interferometry Appl Opt 10 9 1971 2150 2154
11. P. Boone Determination of three orthogonal displacement components from one double exposure hologram Opt Laser Technol 2 1972 162 166
12. P. Gorry General least-squares smoothing and differentiation by the convolution (Savitzky-Golay) method Anal Chem 62 1990 570 573