Characterization of interlayer Cs+ in clay samples using secondary ion mass spectrometry with laser sample modification

Analytical Chemistry

Volumn 76, Issue 10, 2004, Pages 2893-2901

  Groenewold, G S ^a   Avci, R ^b   Karahan, C ^b   Lefebre, K ^b   Fox, R V ^a   Cortez, M M ^a   Gianotto, A K ^a   Sunner, J ^b   Manner, W L ^c  

^a IDAHO NATIONAL LABORATORY   (United States)

^b MONTANA STATE UNIVERSITY   (United States)

^c BRIGHAM YOUNG UNIVERSITY IDAHO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CLAY; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY; ULTRAVIOLET RADIATION;

CLAY SAMPLES; KAOLINITE;

CESIUM;

ALUMINUM SILICATE; CESIUM ION; MONTMORILLONITE; TITANIUM; TITANIUM DIOXIDE;

ADSORPTION; ARTICLE; CLAY; LASER; MASS SPECTROMETRY; MATERIALS; SOIL ANALYSIS; THERMAL ANALYSIS; ULTRAVIOLET IRRADIATION;

EID: 2442671783     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac035400u     Document Type: Article

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