Raman microspectrometry as a new approach to the investigation of molecular recognition in solids: Chloroform-cryptophane complexes

Journal of Physical Chemistry B

Volumn 108, Issue 18, 2004, Pages 5572-5581

  Cavagnat, Dominique ^a   Brotin, Thierry ^b   Bruneel, Jean Luc ^a   Dutasta, Jean Pierre ^b   Thozet, Alain ^c   Perrin, Monique ^c   Guillaume, François ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b UNIVERSITÉ DE LYON   (France)

^c UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; MOLECULAR DYNAMICS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; OPTICAL MICROSCOPY; POLARIZATION; RAMAN SPECTROSCOPY; SENSITIVITY ANALYSIS; X RAY DIFFRACTION;

CRYPTOPHANE COMPLEXES; HEXAGONAL MORPHOLOGY; WAVENUMBERS;

COMPLEXATION;

EID: 2442644000     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0375158     Document Type: Article

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