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Volumn 44, Issue 6, 2004, Pages 899-907

Smart MEMS concept for high secure RF and millimeterwave communications

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DIELECTRIC PROPERTIES; ELECTROMAGNETIC COMPATIBILITY; INSERTION LOSSES; MILLIMETER WAVES; SYSTEMS ANALYSIS; THERMAL STRESS;

EID: 2442570042     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.02.008     Document Type: Review
Times cited : (8)

References (14)
  • 1
    • 0036500073 scopus 로고    scopus 로고
    • MEMS and Si micromachining circuits for high frequency applications
    • Katehi L., et al. MEMS and Si micromachining circuits for high frequency applications. IEEE MTT. 50(3):2003;858-868.
    • (2003) IEEE MTT , vol.50 , Issue.3 , pp. 858-868
    • Katehi, L.1
  • 4
    • 8844273785 scopus 로고    scopus 로고
    • MEMS-A wireless vision, 2001
    • Singapore. July 4-6
    • Dos Los Santos. MEMS-A Wireless Vision, 2001. In: International MEMS Workshop, Singapore. July 4-6, 2001.
    • (2001) International MEMS Workshop
    • Santos, D.L.1
  • 5
    • 2442617526 scopus 로고    scopus 로고
    • Bulk silicon micromachined MEMS switch for millimeter wave applications
    • London
    • Grenier K, et al. Bulk Silicon Micromachined MEMS Switch for millimeter wave applications. European Microwave Conference, London, 2001. p. 181-4.
    • (2001) European Microwave Conference , pp. 181-184
    • Grenier, K.1
  • 6
    • 2442594348 scopus 로고    scopus 로고
    • Fogale Nanotech
    • Fogale Nanotech www.fogale.fr.
  • 8
    • 0000073475 scopus 로고    scopus 로고
    • Lifetime characterization of capacitive RF MEMS switches
    • May
    • Goldsmith C, et al. Lifetime characterization of capacitive RF MEMS switches. In: Proceedings of IEEE IMS symposium, vol 1, May 2001.
    • (2001) Proceedings of IEEE IMS Symposium , vol.1
    • Goldsmith, C.1
  • 10
    • 3042826713 scopus 로고    scopus 로고
    • Investigation of dielectric degradation of microwave capacitive microswitches
    • Mastricht
    • Melle S, et al. Investigation of dielectric degradation of microwave capacitive microswitches. In: IEEE MEMS 2004, Mastricht. p. 141-4.
    • IEEE MEMS 2004 , pp. 141-144
    • Melle, S.1
  • 13
    • 0027814352 scopus 로고
    • Monolithic GaAs HBT p-i-n diode variable gain amplifiers, attenuators, and switches
    • Kobayashi K.W., Oki A.K., Umemoto D.K., Claxton S.K.Z., Streit D.C. Monolithic GaAs HBT p-i-n diode variable gain amplifiers, attenuators, and switches. IEEE MTT. 41(12):1993;2295-2302.
    • (1993) IEEE MTT , vol.41 , Issue.12 , pp. 2295-2302
    • Kobayashi, K.W.1    Oki, A.K.2    Umemoto, D.K.3    Claxton, S.K.Z.4    Streit, D.C.5
  • 14
    • 0032203929 scopus 로고    scopus 로고
    • Compact DC-60 GHz HJFET MMIC switches using ohmic electrode-sharing technology
    • Mizutani H., Funabashi M., Kuzuhara M., Takayama Y. Compact DC-60 GHz HJFET MMIC switches using ohmic electrode-sharing technology. IEEE-MTT. 46(11):1998;1597-1603.
    • (1998) IEEE-MTT , vol.46 , Issue.11 , pp. 1597-1603
    • Mizutani, H.1    Funabashi, M.2    Kuzuhara, M.3    Takayama, Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.