Strong light confinement in microporous photonic silicon structures

Materials Research Society Symposium - Proceedings

Volumn 797, Issue , 2003, Pages 15-20

  Lerondel G ^a   Reece, P ^b   Bruyant, A ^a   Gal, M ^b  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CURRENT DENSITY; ETCHING; ETHANOL; MIRRORS; OPTIMIZATION; PHOTONS; POROSITY; REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY;

ELECTROCHEMICAL ANODIZATION; LIGHT CONFINEMENT; MICROCAVITIES; STRUCTURE QUALITY;

POROUS SILICON;

EID: 2442509818     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-797-w1.7     Document Type: Conference Paper

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