Characteristics of La0.5Sr0.5CoO3 thin films fabricated by a simple metal-organic decomposition technique

Vacuum

Volumn 74, Issue 3-4 SPEC. ISS., 2004, Pages 671-675

  Kim, Kyoung Tae ^a   Kim, Chang Il ^a   Kim, Tae Hyung ^b  

^a Chung Ang University   (South Korea)

^b Yeojoo Technical College   (South Korea)

Author keywords

FeRAM; LSCO; MOD; PZT; Thin film

Indexed keywords

ANNEALING; DECOMPOSITION; DEGRADATION; FABRICATION; FERROELECTRICITY; FILM GROWTH; LANTHANUM COMPOUNDS; MICROSTRUCTURE; SPIN COATING; X RAY DIFFRACTION ANALYSIS;

METAL-ORGANIC DECOMPOSITION TECHNIQUES; SWITCHING CHARGE;

THIN FILMS;

EID: 2442453303     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2004.01.043     Document Type: Article

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