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Organic Electronics

Volumn 6, Issue 4, 2005, Pages 175-181

Importance of ITO surface conditions for the interaction with thin CuPc layers

(5) Andreasson, M a Tengelin Nilsson, M a Andersson, T G a Ilver, L a Kanski, J a

a CHALMERS UNIVERSITY OF TECHNOLOGY (Sweden)

Author keywords

CuPc; ITO; UPS

Indexed keywords

ANODES; COPPER COMPOUNDS; ELECTRONIC PROPERTIES; FERMI LEVEL; HEAT TREATMENT; HOLE MOBILITY; OXIDATION; PHOTOEMISSION; ULTRAVIOLET SPECTROSCOPY;

CUPC; ELECTRONIC INTERACTION; ITO; UPS;

SURFACE PROPERTIES;

EID: 24344474439 PISSN: 15661199 EISSN: None Source Type: Journal
DOI: 10.1016/j.orgel.2005.06.003 Document Type: Article

Times cited : (9)

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