A synthetic control chart for monitoring process dispersion with sample standard deviation

Computers and Industrial Engineering

Volumn 49, Issue 2, 2005, Pages 221-240

  Huang, H J ^a   Chen, F L ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Conforming run length; Control chart; Process dispersion; Variable sampling interval

Indexed keywords

COMPUTER SCIENCE; MONITORING; PROCESS CONTROL; RAW MATERIALS;

CONFORMING RUN LENGTH; CONTROL CHART; PROCESS DISPERSION;

INDUSTRIAL ENGINEERING;

EID: 24344433969     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2004.11.001     Document Type: Article

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