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Quality Engineering
Volumn 15, Issue 4, 2003, Pages 677-680
A note on the lower-sided synthetic chart for exponentials
Author keywords

Average run length; Conforming run length; CUSUM; EWMA; Exponential data; Shewhart chart; Synthetic control chart
Indexed keywords

FUNCTIONS; MATHEMATICAL MODELS; PRODUCT DESIGN; QUALITY CONTROL; STATISTICAL METHODS;
EID: 0038526458     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1081/QEN-120018399     Document Type: Article
Times cited : (23)
References (3)
  • 1
    • 0038385684 scopus 로고    scopus 로고
    • A synthetic control chart for detecting small shifts in the process mean
    • Wu, Z.; Spedding, T.A. A synthetic control chart for detecting small shifts in the process mean. J. Qual. Technol. 2000, 32 (1), 32-38.
    • (2000) J. Qual. Technol. , vol.32 , Issue.1 , pp. 32-38
    • Wu, Z.1    Spedding, T.A.2
  • 2
    • 0033154342 scopus 로고    scopus 로고
    • Robustness of the EWMA control chart to non-normality
    • Borror, C.M.; Montgomery, D.C.; Runger, G.C. Robustness of the EWMA control chart to non-normality. J. Qual. Technol. 1999, 31 (1), 309-316.
    • (1999) J. Qual. Technol. , vol.31 , Issue.1 , pp. 309-316
    • Borror, C.M.1    Montgomery, D.C.2    Runger, G.C.3
  • 3
    • 0031652645 scopus 로고    scopus 로고
    • Designs of one- and two-sided exponential EWMA charts
    • Gan, F.F. Designs of one- and two-sided exponential EWMA charts. J. Qual. Technol. 1998, 30 (1), 55-69.
    • (1998) J. Qual. Technol. , vol.30 , Issue.1 , pp. 55-69
    • Gan, F.F.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.