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Volumn 56, Issue 5, 2005, Pages 908-930

A bifurcation-based decohesion model for simulating the transition from localization to decohesion with the MPM

Author keywords

Bifurcation; Decohesion; Delamination; Localization; MPM

Indexed keywords


EID: 24144483445     PISSN: 00442275     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00033-005-3011-0     Document Type: Article
Times cited : (29)

References (27)
  • 1
    • 0035356870 scopus 로고    scopus 로고
    • Strength of plasma sprayed turbine-blade coatings using an advanced spallation technique
    • K. Baumung, G. Muller, J. Singer, G. I. Kanel and S. V. Razorenov, Strength of plasma sprayed turbine-blade coatings using an advanced spallation technique, Journal of Applied Physics 89 (2001), 6523-6529.
    • (2001) Journal of Applied Physics , vol.89 , pp. 6523-6529
    • Baumung, K.1    Muller, G.2    Singer, J.3    Kanel, G.I.4    Razorenov, S.V.5
  • 4
    • 0003026387 scopus 로고    scopus 로고
    • Continuous and discontinuous failure modes
    • Z. Chen, Continuous and discontinuous failure modes, Journal of Engineering Mechanics 122 (1996), 80-82.
    • (1996) Journal of Engineering Mechanics , vol.122 , pp. 80-82
    • Chen, Z.1
  • 6
    • 0036738066 scopus 로고    scopus 로고
    • An evaluation of the MPM for simulating dynamic failure with damage diffusion
    • Z. Chen, W. Hu, L. Shen, X. Xin and R. Brannon, An evaluation of the MPM for simulating dynamic failure with damage diffusion, Engineering Fracture Mechanics 69 (2002), 1873-1890.
    • (2002) Engineering Fracture Mechanics , vol.69 , pp. 1873-1890
    • Chen, Z.1    Hu, W.2    Shen, L.3    Xin, X.4    Brannon, R.5
  • 9
    • 0000642710 scopus 로고    scopus 로고
    • Pattern formation during delamination and buckling of thin films
    • K. M. Crosby and R. M. Bradley, Pattern formation during delamination and buckling of thin films, Physical Review E 59 (1999), R2542-R2545.
    • (1999) Physical Review E , vol.59
    • Crosby, K.M.1    Bradley, R.M.2
  • 10
    • 24144438327 scopus 로고    scopus 로고
    • Elasticity, plasticity and fracture of thin films and MEMS materials Part II: Size effects in submicron gold films
    • Submitted to
    • H. D. Espinosa and B. C. Prorok, Elasticity, plasticity and fracture of thin films and MEMS materials Part II: Size effects in submicron gold films. Submitted to Journal of the Mechanics and Physics of Solids, 2002.
    • (2002) Journal of the Mechanics and Physics of Solids
    • Espinosa, H.D.1    Prorok, B.C.2
  • 11
    • 77956671586 scopus 로고    scopus 로고
    • Delamination of compressed thin films
    • G. Gioia and M. Ortiz, Delamination of compressed thin films, Advances in Applied Mechanics 33 (1997), 119-192.
    • (1997) Advances in Applied Mechanics , vol.33 , pp. 119-192
    • Gioia, G.1    Ortiz, M.2
  • 12
    • 0041302634 scopus 로고    scopus 로고
    • Implicit time integration for the material point method: Quantitative and algorithmic comparisons with the finite element method
    • J. E. Guilkey and J. A. Weiss, Implicit time integration for the material point method: Quantitative and algorithmic comparisons with the finite element method, International Journal for Numerical Methods in Engineering 57 (2003), 1323-1338.
    • (2003) International Journal for Numerical Methods in Engineering , vol.57 , pp. 1323-1338
    • Guilkey, J.E.1    Weiss, J.A.2
  • 13
    • 0000801214 scopus 로고
    • The particle-in-cell computing method for fluid dynamics in fundamental methods in hydrodynamics
    • edited by B. Alder, S. Fernbach and M. Rotenberg, Academic Press
    • F. H. Harlow, The particle-in-cell computing method for fluid dynamics in fundamental methods in hydrodynamics. In Experimental Arithmetic, High-Speed Computations and Mathematics, edited by B. Alder, S. Fernbach and M. Rotenberg, Academic Press 1964, 319-346.
    • (1964) Experimental Arithmetic, High-speed Computations and Mathematics , pp. 319-346
    • Harlow, F.H.1
  • 14
    • 0036470628 scopus 로고    scopus 로고
    • Wrinkling of a compressed elastic film on a viscous layer
    • R. Huang and Z. Suo, Wrinkling of a compressed elastic film on a viscous layer, Journal of Applied Physics 91 (2002), 1135-1142.
    • (2002) Journal of Applied Physics , vol.91 , pp. 1135-1142
    • Huang, R.1    Suo, Z.2
  • 18
    • 5244367758 scopus 로고    scopus 로고
    • Tethered membranes far from equilibrium: Buckling dynamics
    • D. Moldovan and L. Golubovic, Tethered membranes far from equilibrium: buckling dynamics, Physical Review E 60 (1999), 4377-4384.
    • (1999) Physical Review E , vol.60 , pp. 4377-4384
    • Moldovan, D.1    Golubovic, L.2
  • 21
    • 0002863812 scopus 로고    scopus 로고
    • Residual stress, microstructure, and structure of Tungsten thin films deposited by magnetron sputtering
    • Y.-G. Shen, Y.-W. Mai, Q. C. Zhang, D. R. McKenzie, W. D. Fall and W. E. McBride, Residual stress, microstructure, and structure of Tungsten thin films deposited by magnetron sputtering, Journal of Applied Physics 87 (2000), 177-187.
    • (2000) Journal of Applied Physics , vol.87 , pp. 177-187
    • Shen, Y.-G.1    Mai, Y.-W.2    Zhang, Q.C.3    McKenzie, D.R.4    Fall, W.D.5    McBride, W.E.6
  • 24
    • 24144493880 scopus 로고    scopus 로고
    • Combined atomistic and continuum simulation for fracture and corrosion
    • To be published, edited by W. Gerberich and W. Yang. Elsevier Science, New York
    • H. Tan, Combined atomistic and continuum simulation for fracture and corrosion. To be published in Comprehensive Structural Integrity, Vol. 8, edited by W. Gerberich and W. Yang. Elsevier Science, New York, 2002.
    • (2002) Comprehensive Structural Integrity , vol.8
    • Tan, H.1
  • 25
    • 0344558738 scopus 로고
    • Fracture-mechanics of a new Blister test with stable Crackgrowth
    • K. T. Wan and Y.-W. Mai, Fracture-mechanics of a new Blister test with stable Crackgrowth, Acta Metallurgien et Materialia 43 (1995), 4109-4115.
    • (1995) Acta Metallurgien et Materialia , vol.43 , pp. 4109-4115
    • Wan, K.T.1    Mai, Y.-W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.