Pattern formation during delamination and buckling of thin films

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 59, Issue 3, 1999, Pages R2542-R2545

  Crosby, Kevin M ^a   Bradley, R Mark ^b  

^a CARTHAGE COLLEGE   (United States)

^b Veterinary Dentistry and Oral Surgery   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000642710     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.59.R2542     Document Type: Article

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