Improved boundary element method for fast 3-D interconnect resistance extraction

IEICE Transactions on Electronics

Volumn E88-C, Issue 2, 2005, Pages 232-238

  Wang, Xiren ^a   Liu, Deyan ^b   Yu, Wenjian ^a   Wang, Zeyi ^a  

^a TSINGHUA UNIVERSITY   (China)

^b University of California Santa Cruz   (United States)

Author keywords

Fast extraction; Improved boundary element method; Interconnect resistance

Indexed keywords

BOUNDARY ELEMENT METHOD; COMPUTATIONAL METHODS; COMPUTER SOFTWARE; MATRIX ALGEBRA; PARAMETER ESTIMATION;

FAST EXTRACTION; IMPROVED BOUNDARY ELEMENT METHOD; INTERCONNECT RESISTANCE; QUASI-CUTTING SCHEME;

ELECTRIC RESISTANCE;

EID: 24144460605     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: 10.1093/ietele/e88-c.2.232     Document Type: Article

References (20)

1. A.S. Brown, "Fast films," IEEE Spectr., vol.40, no.2, pp.36-40, 2003.
2. W. Yu, Z. Wang, and J. Gu, "Fast capacitance extraction of actual 3-D VLSI interconnects using quasi-multiple medium accelerated BEM," IEEE Trans. Microw. Theory Tech., vol.51, no.1, pp. 109-119, 2003.
3. Z. Wang and Q. Wu, "A two-dimensional resistance simulator using the boundary element method," IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol.11, no.4, pp.497-504, 1992.
4. A.J. Kemp and J.A. Pretoriu, "The generation of a mesh for resistance calculation in intergrated circuits," IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol.7, no.10, pp.1029-1037, 1988.
5. J.P. Hwang, "REX - A VLSI parasitic extraction tool for electromigration and signal analysis," ACM/IEEE Design Automation Conference, pp.717-722, 1991.
6. L. Ladage and R. Leupers, "Resistance extraction using a routing algorithm," ACM/IEEE Design Automation Conference, pp.38-42, 1993.
7. M. Glegharbour and J.M. Drake, "Calculation of multiterminal resistance in integrated circuits," IEEE Trans. Circuits Syst., vol.33, no.4, pp.462-465, 1986.
8. T. Mitsuhashi and K. Yoshida, "A resistance calculation algorithm and its application to circuit extraction," IEEE Trans. Comput.Aided Des. Integr. Circuits Syst., vol.16, no.3, pp.337-345, 1987.
9. W. Sun, W. Hong, and W.W. Dai, "Resistance extraction using super-convergence accelerated boundary element method," Asia-Pacific Microwave Conference, vol.3, pp. 1061-1064, 1997.
10. W. Yu and Z. Wang, "Fast quasi-multiple medium method for 3-D BEM calculation of parasitic capacitance," Computers and Mathematics with Applications, vol.45, no. 12, pp. 1883-1894, 2003.
11. K.M. Cham, S. Oh, J.L. Moll, K. Lee, P.V. Voorde, and D. Chin, Computer-Aided Design and VLSI Device Development, second ed. Cluwer Academic Publishers, Boston, 1988.
12. F. Chen and D. Gardne, "Influence of line dimensions on the resistance of Cu interconnections," IEEE Electron Device Lett., vol.19, no.12, pp.508-510, 1998.
13. Y. Cao, X. Huang, D. Sylvester, T. King, and C. Hu, "Impact of onchip interconnect frequency-dependent R(f)L(f) on digital and RF design," IEEE International ASIC/SOC Conference, pp.438-442, 2002.
14. Y. Saad and M.H. Schultz, "GMRES: A generalized minimal residual algorithm for solving nonsymmetric linear systems," SIAM J. Sci. Staus. Comput., vol.7, no.3, pp.856-869, 1986.
15. A.J. Walton, R.J. Holwill, and J.M. Robertson, "Numerical simulation of resistive interconnects for integrated circuits," IEEE J. Solid-State Circuits, vol.20, no.6, pp.1252-1258, 1985.
16. Avant! Corp., Raphael Reference Manual, 2000.
17. Z. Zhao and X. Wang, "Error estimation and h adaptive boundary elements," Engineering Analysis with Boundary Elements, vol.23, no.10, pp.793-803, 1999.
18. M. Kamon, M.J. Tsuk, and J.K. White, "FastHenry: A multipole-accelerated 3-D inductance extraction program," IEEE Trans. Microw. Theory Tech., vol.42, no.9, pp. 1750-1758, 1994.
19. W.T. Weeks, L.L. Wu, M.F. McAllister, and A. Singh, "Resistive and inductive skin effect in rectangular conductors," IBM J. Res. Dev., vol.23, no.6, pp.652-660, 1979.
20. Semiconductor Industry Association, "International technology roadmap for semiconductors," 2001, [online]. Available: http://public.itrs.net/