Electrostatically self-assembled multilayers of chitosan and xanthan studied by Atomic Force Microscopy and micro-interferometry

Macromolecular Symposia

Volumn 227, Issue , 2005, Pages 161-172

  Maurstad, Gjertrud ^a,b   Bausch, Andreas R ^b   Sikorski, Pawel ^a   Stokke, Bjørn T ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Atomic force microscopy (AFM); Chitosan; DW RICM; Xanthan

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHITIN; MULTILAYERS; STIFFNESS;

BILAYERS; CHAIN STIFFNESS; CHITOSAN; XANTHAN;

SELF ASSEMBLY;

EID: 24044515002     PISSN: 10221360     EISSN: None     Source Type: Journal    
DOI: 10.1002/masy.200550916     Document Type: Conference Paper

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