Nanometer-Sized Silver Particle Measurements by Low Pressure Differential Mobility Analyzer and its Classification Performance

Kagaku Kogaku Ronbunshu

Volumn 26, Issue 6, 2000, Pages 776-784

  Kuga, Yoshikazu ^a   Furuyama, Yoshiyuki ^a   Ando, Koji ^a   Okuyama, Kikuo ^b   Takeuchi, Kazuo ^c  

^a MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

^c INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

classification; differential mobility analyzer (DMA); low pressure; nm sized particles; TEM

Indexed keywords

EID: 24044471047     PISSN: 0386216X     EISSN: 13499203     Source Type: Journal    
DOI: 10.1252/kakoronbunshu.26.776     Document Type: Article

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